Fabrication of Poly—Si TFT by Al—induced Lateral Crystallization at Low Temperature

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    摘要 Usinganewlow-temperatureprocess(<600℃),thepoly-SiTFTwasfabricatedbymetal-inducedlateralcrystallization(MILC).Anultrathinaluminumlayerwasdepositedona-Sifilmandselectivelyformedbyphotolithography.Thefilmswerethenannealedat560℃toobtainlaterallycrystallizedpoly-Sifilm,whichisusedasthechannelareaofaTFT.Thepoly-SiTFTshowedanon/offcurrentratioofhigherthan1×106atadrainvoltageof5V.TheelectricalpropertiesaremuchbetterthanTFTfabricatedbyconventionalcrystallizationat600℃.
    机构地区 不详
    出版日期 2001年01月11日(中国Betway体育网页登陆平台首次上网日期,不代表论文的发表时间)
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