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Etching and Damage Action on Microbes’ Cells by Low Energy N~+ Beam

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DOI wjvzz8qkd7/1044050

作者宋道军;余增亮

机构地区不详

出处《等离子体科学与技术：英文版》 2000年4期

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分类 [核科学技术][核技术及应用]

出版日期 2000年04月14日（中国Betway体育网页登陆平台首次上网日期，不代表论文的发表时间）

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等离子体科学与技术：英文版

等离子体科学与技术：英文版

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